DESCRIPTION

The JEM 2100F is a field emission TEM with beam energy ranging 80-200 KeV. The nominal resolution is 0.1 nm, and atomic resolution is ordinarily achieved. The image acquisition is routed by means of Orius 1000 CCD camera (Gatan). It is possible to work in STEM mode (resolution 0.2 nm) with bright field and annular dark-field detectors. The system is equipped with an EDX detector (X-Max80t, Oxford) with Aztech acquisition and analysis software.

ACCESS

The use of the instrument requires the presence of a trained operator.

LOCATION

Univerza v Novi Gorici, Materials Research Laboratory (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Mattia Fanetti
UNG | Tel: +386 5 3653 532

mattia.fanetti@ung.si

DESCRIPTION

The JSM 7100F is a field emission scanning electron microscope. The beam energy ranges from 1 to 30 KeV (beam energies lower than 1 KeV can also be accessed by Gentle Beam technology). In standard conditions a resolution <5 nm is achieved, while the best nominal resolution is 1.5 nm at 30 KeV. The microscope is equipped with secondary electon detector, backscattered electron detector, and trough-the-lens (TTL) energy-filtered detector. Attached equipment:

• EDX detector (X-Max 80, Oxford) with Aztech acquisition and analysis software.
• Cathodoluminescence detector (MonoCL4, Gatan), 300-750 nm
• Heating stage (Kammrath&Weiss) for nominal temperature range RT-800CACCESS

ACCESS

The use of the instrument requires the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Materials Research Laboratory (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Mattia Fanetti
UNG | Tel: +386 5 3653 532

mattia.fanetti@ung.si

DESCRIPTION

PECS is an apparatus to easily produce thin films and coatings on specimens. Several materials are available (C, Ag, Au/Pd, Pt, Cr, Ni). Typical deposition rate, which is measured in situ by quartz microbalance is from 0.2 to 1 Å/s. The deposition is stopped automatically at the set thickness. The sample can be rotated and rocked during deposition. An Ar+ etching gun is also present in the same system, with energy 1-10 KeV.

ACCESS

The use of the instrument requires the presence of an experienced operator. Access is allowed for external users (compatibly with internal use) which are experienced in the use of the instrument. Support can be provided at the beginning.

LOCATION

Univerza v Novi Gorici, Materials Research Laboratory (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Mojca Vrčon
UNG | Tel: +386 5 3653 540

mojca.vrcon@ung.si

DESCRIPTION

Several instruments for sample preparation: diamond wire saw (Well), ultrasonic disc cutter (Gatan), dimple grinder (Gatan), manual disc grinder (Gatan), rotating grinding/polishing machine, precision ion-polishing system (PIPS, Gatan). The latter is polishing with Ar+ ion beam (1-5 KeV) at grazing incidence, and is used to open a hole at the center of 3 mm disc TEM specimens.

ACCESS

The use of the instruments requires the presence of an experienced operator. Access is allowed for external users (compatibly with internal use) which are experienced in the use of the instruments. Support can be provided at the beginning.

LOCATION

Univerza v Novi Gorici, Materials Research Laboratory (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Mattia Fanetti, Mojca Vrčon
UNG | Tel: +386 5 3653 532 / 540

mattia.fanetti@ung.si

or mojca.vrcon@ung.si

DESCRIPTION

The JEOL X-section polisher allows for the preparation of extemely flat X-sections of a wide variety of materials, from ceramics, to metals, to porous materials. To some extent, it can operate also on soft materials.The Ar+ ion beam energy goes from 2 to 6 KeV. The specimen is rocking during the milling.X-section 1-2 mm wide and 500 m deep can be obtained in few hours.

ACCESS

The use of the instrument requires the presence of a trained operator.

LOCATION

Univerza v Novi Gorici, Materials Research Laboratory (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Mattia Fanetti
UNG | Tel: +386 5 3653 532

mattia.fanetti@ung.si

DESCRIPTION

The available facility operates in ultra high vacuum with a monochromatized Al K-alpha X-ray source at 1486.6 eV and an hemispherical electrons’ spectrometer from Scienta-Omicron. The ultimate energy resolution of the system is 400 meV. The spot size of the x-ray source can be varied from 400 to 950 microns. The sample is mounted on a cryogenic manipulator with controllable temperature in the range (350-20)K.
The system also offers a fast entry and a sample preparation chamber, equipped with LEED (Low Energy Electrons Diffraction), ion sputter gun, sample heating stage up to 800 C.

ACCESS

The use of the facility requires the presence of a trained operator.

LOCATION

Univerza v Novi Gorici, Laboratory of Quantum Optics (ground floor)
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Barbara Ressel
UNG | Tel: +386 5 3653 531

barbara.ressel@ung.si

DESCRIPTION

TLS is highly sensitive detection system which anables to determine a wide range of substances at the level of 10-6 AU. Consists of excitation beam laser with the emission line from 400 up to over 800 nm and different powers that are chosen according to the absorption spectrum of the detected compound. It is also equipped with low power probe beam laser, mechnaical chopper, amplified detector and optical system due to which it is possible to optimize the experimental conditions.
Attached equipment:

• FIA/μFIA – system for injective analysis
• HPLC – system for liquid chromatography
• IC – system for ionic chromatography

ACCESS

The use of the instrument requires the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for environmental and life sciences (2nd floor), Vipavska cesta 13, 5000 Nova Gorica

Contact person

Dorota Korte
UNG | Tel: +386 5 3315 238

Dorota.Korte@ung.si

DESCRIPTION

GC-ECD/FID is a gas chromatographer equipped with Electron Capture (ECD) and Flame Ionization (FID) detector. The instrument is also equipped with an Gerstel MPS2 autosampler and head space. With the presented instrument is possible to detect a large spectrum of volatile organic compounds, present in traces. The Gestel MPS 2 autosampler allows also the thermal desorption and extraction, which allows as to determinate ultra-trace organic compounds in aqueous and gases matrices.

ACCESS

The use of the instrument requires the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for environmental and life sciences (2nd floor), Vipavska cesta 13, 5000 Nova Gorica

Contact person

Dorota Korte
UNG | Tel: +386 5 3315 238

Dorota.Korte@ung.si

DESCRIPTION

BDS is a home-made system that consists of excitation beam laser with the emission line from 400 up to over 800 nm and different powers that are chosen according to the absorption spectrum of the measured sample. It is also equipped with low power probe beam laser, electro-optical modulator (EO), quadrant photodetector and optical system due to which it is possible to optimize the experimental conditions. EO provides modulation frequency from DC to GHz and thus, have capability of sample depth profiling and separate signals arising only from the upper layers of the sample (10 nm – 100 μm, several 10 - 100 kHz modulation frequencies) from signals originating from deeper layers and the bulk sample, which we can detect by the use of lower modulation frequencies (10 – 1000 Hz). Furthermore, due to the possibility of tight focusing of the excitation laser provides high spatial resolution of measurement providing the possibility of sample surface profiling.
BDS can be applied to observe heat transfer across thin nano-layers and nano-structures which takes place on sub-nanosecond times scales.

ACCESS

The use of the instrument requires the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for environmental and life sciences (2nd floor), Vipavska cesta 13, 5000 Nova Gorica

Contact person

Dorota Korte
UNG | Tel: +386 5 3315 238

Dorota.Korte@ung.si

DESCRIPTION

The EPS150-TRIAX is a versatile, highly-precise manual probe station for wafers and substrates up to 150 mm. Equipped with 4 triaxial probes on DPP210 micropositioners, triaxial chunk, it allows to measure pA currents. Probes connected to 2-channel Keysight B2912A multimeter. Dark-box enclosure for EM shielding.

ACCESS

The use of the instrument require the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for Organic Matter Physics
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Egon Pavlica
UNG | Tel: +386 5 3653 513

egon.pavlica@ung.si

DESCRIPTION

DALI model A is a versatile lithography tool, which can be used to illuminate highly-precise patterns using laser beam of diameter of 1 and 3 μm and wavelength of 375 nm. User-friendly software is used to design patterns. Optical camera is used to position and align patterns. The tool is located in a clean-room.

ACCESS

The use of the instrument require the presence of a trained operator and basic training of working in clean-room. For prolonged access, training of laser lithography can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for Organic Matter Physics
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Egon Pavlica
UNG | Tel: +386 5 3653 513

egon.pavlica@ung.si

DESCRIPTION

A100 is a versatile atomic force microscope suited to a wide variety of applications including bioscience, surface science, semiconductor technology, magnetic media, polymer science, optics, chemistry and medicine. The close loop flexure scanning stage guarantees absolute positioning and high planarity. Kelvin-probe microscopy is available with conductive probes. Typical lateral resolution is 3nm and depends on the probe tip radius. Vertical resolution is below 1nm.

ACCESS

The use of the instrument require the presence of a trained operator. For prolonged access, training can be provided upon agreement.

LOCATION

Univerza v Novi Gorici, Laboratory for Organic Matter Physics
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Egon Pavlica
UNG | Tel: +386 5 3653 513

egon.pavlica@ung.si

DESCRIPTION

Time-of-flight photoconductivity is an experimental method to measure charge carrier mobility in semiconducting and insulating materials. This setup is equipped with a tunable wavelength pulsed laser (NT342A). Therefore, in addition to time-resolved also the spectroscopic study of photon-to-electron conversion dynamics can be characterized. Sample preparation and characterization is performed in N2 glovebox. Optionally, the samples can be cooled to temperatures down to 15K in a closed-cycle He-cooled cryostat with quartz window and GHz feed-through connection.

ACCESS

The use of the instrument require the presence of a trained operator.

LOCATION

Univerza v Novi Gorici, Laboratory for Organic Matter Physics
Vipavska 11c, SI-5270 Ajdovščina, Slovenija

Contact person

Egon Pavlica
UNG | Tel: +386 5 3653 513

egon.pavlica@ung.si