DESCRIPTION
Scanning Electron Microscope (SEM) has an nominal ultimate resolution of 1.3 nm at 20 kV. The operating voltage range of the electron beam is from 0.1-30kV, and the probe current (4 pA – 20 nA) with high stability (0.2%/h). It is provided by an in-lens secondary electron detector that provides low-noise imaging. The instrument has the possibility to operate in variable pressure (VP) conditions (range 10-133 Pa), with a dedicated secondary electron detector, allowing analysis of non-conductive samples without metal coating. A back-scattered detector is available and can be operated in both high vacuum and VP conditions. The instrument is equipped with an Energy Dispersive X-ray Spectrometer (EDS) Bruker Quantax 200, based on a silicon drift detector (SDD) which avoids LN2 cooling.
ACCESS
The use of the instrument require the presence of a trained operator. For prolonged access, training can be provided upon agreement.
LOCATION
UNIVE DSMN – Dipartimento di Scienze Molecolari e Nanosistemi,
c/o Edificio ETA, Campus Scientifico
via Torino, 155
30172 Venezia-Mestre, Italia
Contact person
Federica Rigoni
DSMN | +39-041 234 6715
federica.rigoni@unive.it
